XRD Diffractometer XRD-50LS
XRD Diffractometer XRD-50LS is a multifunctional unit that combines hardware and software systems for precise data collection. Offers a wide 2θ scanning range from -6 to 160° and variable scanning speeds of 0.0012° to 50°/min for analysis. Incorporates high-precision diffraction angle measuring system for accurate and reliable measurements. Equipped with PC or SC, SDD, and high-speed 1D semiconductor array detector for fast operation.
X-ray Tube$54,050 / Pack of 1
Variable counting and scanning modes
Includes X-ray generator control system
High frequency high voltage control technology
Adjustable operation
Metal-ceramic tube for multiple target materials
Versatile testing with functional accessories
Sample level goniometer for precise sample position
| X-ray Tube | Metal ceramic tube |
| X-Ray Source Material | Cu, Fe, Co, Cr, Mo, etc. |
| Focus Size | 1×10 mm, 0.4×14 mm or 2×12 mm |
| Stability | ≤0.005% |
| Tube Current | 5 to 50 mA |
| Tube Voltage | 10 to 60 kV |
| Power | 2.4 kW |
| Rated Power | 3 kV (HV, HF control technology) |
| Goniometer Structure | Sample level (θ to θ) |
| Diffraction Radius | 225 mm |
| 2θ Scanning Range | -6 to 160° |
| Scanning Speed | 0.0012° to 50°/min |
| Scanning Fashion | θs/θd linkage / single action; continuous, stepping |
| Minimal Stepping Angle | 1/10000° |
| Angle Repeatable Accuracy | 1/10000° |
| 2θ Angular Linearity | International standard sample (Si, Al203), the angle deviation of all peak in full spectrum are not more than ±0.022 |
| Angle Locating Speed | 1500°/min |
| Detector | Proportional counters (PC) or scintillation counter (SC), Silicon drift detector (SDD), High speed one-dimensional semiconductor array detector |
| Maximum Linear Count Rate | >5×105 cps (PC, SC with the compensate function of miss counting), 15×104 (SSD), 9×102 (1D array) |
| Energy Resolution Ratio | ≤25%（PC, one-dimensional array), ≤50%(SC), ≤200 eV (SDD) |
| Counting Fashion | Differential coefficient or integral, PHA automatically, dead time regulate |
| System Measure Stability | ≤0.01% |
| Scattered Ray Dose | 1uSv/h |
| Machine Dimension (L × W × H) | 1000 × 800 × 1600 mm |
| 01 Box Package Dimension (L × W × H) | 1190 × 1020 × 2000 mm |
| 02 Box Package Dimension (L × W × H) | 1250 × 1035 × 1050 mm |
| Net Weight | 340 kg |
| 01 Box Gross Weight | 350 kg |
| 02 Box Gross Weight | 240 kg |
Mirror (Gobel)
Geology and Mining: Employed for identifying and analyzing minerals present in rocks, soils, and sediments.
Catalysis and Chemical Engineering: Utilized to characterize catalysts and catalyst supports, providing insights into their crystal structures and surface properties.
Pharmaceuticals: Used for identifying the crystalline forms of drugs, which can affect their stability, solubility, and bioavailability.
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