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XRD Diffractometer XRD-80LS

XRD Diffractometer XRD-80LS

XRD Diffractometer XRD-80LS offers versatile analysis using diverse X-ray source materials and covers a scanning range from 0 to 164 degrees. Allows phase identification in unknown samples and analysis in known mixtures for complete material characterization. Utilize proportional/scintillation counters detectors to measure X-ray photons and to generate diffraction patterns. Our diffractometer performs efficient scanning with high throughput capabilities for quick analysis.

X-ray Tube

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  • Horizontal goniometer setup for precise sample positioning

  • Includes auto-switching dual wavelength optic

  • Facilitates chemical analysis with X-ray diffraction

  • Temperature-dependent crystal structure analysis

  • Provides programmable operation

  • Offers peak performance with reduced downtime

X-ray Tube Glass tube, Ceramic tube, Ripple Ceramic tube
X-Ray Source Material Cu, Fe, Co, Cr, Mo, etc.
Focus Size 1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm
Stability ≤ 0.01 %
Tube Current 5 to 80 mA
Tube Voltage 10 to 60 kV
Goniometer Structure Horizontal (Ø to 2 Ø)
Radius of Diffraction 185 mm
Scanning Range 0 to 164
Scanning Speed 0.0012º to 70 º min
Maximum Resolving Speed 100 º / min
Scanning Mode Ø to 2 Ø linkage, Ø, 2 Ø single action; continuous/stepping
Angle Repeatable Accuracy 1 / 1000 º
Minimal Stepping Angle 1 / 1000 º
Detector Proportional/Scintillation counters
Linearity Count 5 × 105 CPS
Energy Resolution ≤ 25 % (PC), ≤ 50 % (SC)
Counting Fashion Differential Coefficient / integral, PHA automatically, Dead time regulate
Stability of System measure ≤ 0.01 %
Scattered Rays Dose ≤ 1 µ Sv/h
Integrative Stability ≤ 0.5 %
Rated Power 3 kW
Dimension 1100 × 850 × 1750 mm
Weight 25 kg

Material Science: Identifying crystalline phases, analyzing phase transitions, and characterizing crystal structures in materials.

Quality Control: Verifying the composition and properties of materials in manufacturing processes.

Chemistry: Determining atomic and molecular arrangements in compounds, identifying   polymorphs, and assessing substance purity.

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