XRD Diffractometer XRD-80LS offers versatile analysis using diverse X-ray source materials and covers a scanning range from 0 to 164 degrees. Allows phase identification in unknown samples and analysis in known mixtures for complete material characterization. Utilize proportional/scintillation counters detectors to measure X-ray photons and to generate diffraction patterns. Our diffractometer performs efficient scanning with high throughput capabilities for quick analysis.
X-ray TubeHorizontal goniometer setup for precise sample positioning
Includes auto-switching dual wavelength optic
Facilitates chemical analysis with X-ray diffraction
Temperature-dependent crystal structure analysis
Provides programmable operation
Offers peak performance with reduced downtime
X-ray Tube | Glass tube, Ceramic tube, Ripple Ceramic tube |
X-Ray Source Material | Cu, Fe, Co, Cr, Mo, etc. |
Focus Size | 1 × 10 mm/ 0.4 × 14 mm/ 2 × 12 mm |
Stability | ≤ 0.01 % |
Tube Current | 5 to 80 mA |
Tube Voltage | 10 to 60 kV |
Goniometer Structure | Horizontal (Ø to 2 Ø) |
Radius of Diffraction | 185 mm |
Scanning Range | 0 to 164 |
Scanning Speed | 0.0012º to 70 º min |
Maximum Resolving Speed | 100 º / min |
Scanning Mode | Ø to 2 Ø linkage, Ø, 2 Ø single action; continuous/stepping |
Angle Repeatable Accuracy | 1 / 1000 º |
Minimal Stepping Angle | 1 / 1000 º |
Detector | Proportional/Scintillation counters |
Linearity Count | 5 × 105 CPS |
Energy Resolution | ≤ 25 % (PC), ≤ 50 % (SC) |
Counting Fashion | Differential Coefficient / integral, PHA automatically, Dead time regulate |
Stability of System measure | ≤ 0.01 % |
Scattered Rays Dose | ≤ 1 µ Sv/h |
Integrative Stability | ≤ 0.5 % |
Rated Power | 3 kW |
Dimension | 1100 × 850 × 1750 mm |
Weight | 25 kg |
Material Science: Identifying crystalline phases, analyzing phase transitions, and characterizing crystal structures in materials.
Quality Control: Verifying the composition and properties of materials in manufacturing processes.
Chemistry: Determining atomic and molecular arrangements in compounds, identifying polymorphs, and assessing substance purity.
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